IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032

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HK LEE HING INDUSTRY CO., LIMITED

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IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032

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IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032

IEC Standard Articulated Test Probe is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the ...

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